全球光譜質(zhì)譜屆極負(fù)盛名的大咖級(jí)人物、ICP-MS發(fā)明人之一、美國(guó)愛荷華州立大學(xué)博士導(dǎo)師、美國(guó)Ames國(guó)家實(shí)驗(yàn)室**科學(xué)家——Robert Samuel Houk教授將于今年十月訪問中國(guó)并帶來(lái)高級(jí)別的學(xué)術(shù)報(bào)告。

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R.S.Houk教授在ICP質(zhì)譜儀器設(shè)計(jì)和應(yīng)用領(lǐng)域耕耘了幾十年，取得過(guò)耀眼的成就。他是發(fā)表ICP-MS儀器領(lǐng)域文章的**人，此后陸續(xù)在各種權(quán)威雜志上發(fā)表了
兩百多篇相關(guān)論文，并在化學(xué)界獲獎(jiǎng)無(wú)數(shù)：

美國(guó)化學(xué)會(huì)光譜化學(xué)獎(jiǎng)（ACS Award for Spectrochemical 2012）

分析化學(xué)獎(jiǎng)（Anachem Award, Association for Analytical Chemistry 2000）(affiliated with ACS Detroit Section)?

美國(guó)化學(xué)會(huì)化學(xué)儀器獎(jiǎng)（ACS Award for Chemical Instrumentation 1993）；??

匹茲堡大會(huì)Maurice F. Hasler獎(jiǎng)，該獎(jiǎng)項(xiàng)表彰“對(duì)光譜學(xué)領(lǐng)域的重大貢獻(xiàn)，導(dǎo)致廣泛用途的應(yīng)用”（1993）?（Maurice F. Hasler Award from Spectroscopy Society of Pittsburgh and Fisons (1993). ?This award recognizes "significant contributions to the field of spectroscopy that have resulted in applications of broad utility."）

美國(guó)應(yīng)用光譜Lester W. Strock?獎(jiǎng)（Co-recipient, Lester W. Strock Award from Society?for Applied Spectroscopy (1986)?）

美國(guó)分析化學(xué)雜志60篇最有影響力原創(chuàng)文章（Original ICP-MS paper chosen to be reprinted as “one of the 60 most influential papers published in the journal Analytical Chemistry," （1994））

R．S．Houk教授任職美國(guó)愛荷華州立大學(xué)教授和美國(guó)能源部歐姆斯國(guó)家實(shí)驗(yàn)室**科學(xué)家（Ames Lab）的同時(shí)，還擔(dān)任過(guò)：

美國(guó)質(zhì)譜學(xué)會(huì)雜志副主編（Associate Editor, Journal of the American Society for Mass Spectrometry (1989-1994)）；

質(zhì)譜百科全書——無(wú)機(jī)質(zhì)譜卷編輯（Volume Editor, Inorganic Mass Spectrometry, Encyclopedia of Mass Spectrometry, 2002-2008）?

光譜化學(xué)編輯顧問委員會(huì)委員（Editorial Advisory Board, Spectrochimica Acta, Part B (1989-present)）

原子光譜分析期刊編輯顧問委員會(huì)委員（Editorial Advisory Board, Journal of Analytical Atomic Spectrometry (1995-2005)）

日本鋼鐵研究所期刊編輯顧問委員會(huì)委員（Editorial Advisory Board, Journal of the Iron & Steel Institute of Japan, (2000-2006)）

美國(guó)質(zhì)譜學(xué)會(huì)元素分析興趣小組主席（Chairman, Elemental Analysis Interest Group, American Society for Mass Spectrometry (1990-1994)）。

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R．S．Houk教授的導(dǎo)師更是大名鼎鼎的ICP光譜之父V. A. Fassel法賽爾教授，?Fassel是ICP光譜的發(fā)明人，他明確定義了上千條可應(yīng)用的光譜譜線，他的貢獻(xiàn)極大地促進(jìn)了光譜化學(xué)的發(fā)展和進(jìn)步，是國(guó)際化學(xué)界公認(rèn)的杰出科學(xué)家，?曾獲美國(guó)應(yīng)用光譜學(xué)會(huì)獎(jiǎng)、匹茲堡光譜學(xué)會(huì)獎(jiǎng) 、美國(guó)化學(xué)會(huì)分析化學(xué)獎(jiǎng)、化學(xué)儀器儀表獎(jiǎng)??

這師徒二人的成就造就了**ICP光譜和ICP-MS成為分析化學(xué)中普遍且主要的無(wú)機(jī)分析應(yīng)用手段。R.S.Houk教授將于十月來(lái)華訪問，屆時(shí)會(huì)有一系列高級(jí)別的學(xué)術(shù)報(bào)告呈現(xiàn)，饕餮盛宴敬請(qǐng)期待！

Agenda

?Professor Robert S. Houk Beijing Visiting?

Date

Agenda

Oct. 9

Monday

Attend BCEIA: Technique section, key note speaker at Mass Spectrometry section

25min talk

Topic: MASS SPECTROMETRY FROM ATOMS TO METABOLITES

Oct. 11

Wednesday

Morning?Seminar organized by LABOR PRAXIS.at BCEIA

30min talk

Topic: Sample preparation and introduction for Mass Spectrometry

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Night:?Reception, Welcome Professor?R.S.Houk?and?LabTech 15years

Short speech, Penal discussion with top scientist: 30min

Oct. 13

Friday

Share?the experience with LabTech Beijing people and Visit LabTech facility

Topic:?First ICP-MS paper and ICP-MS instrument

更詳細(xì)的資訊將隨后發(fā)布！

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附Robert Samuel Houk教授簡(jiǎn)歷如下，感興趣的朋友可以深入了解。

PROFESSIONAL BIOGRAPHY

ROBERT SAMUEL HOUK

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1. EDUCATION

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College

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???Undergraduate???????????????????????????????????????? B.S., Slippery Rock State College 1974

??????????????????????????????????????????????????????????????????????????????? Slippery Rock, Pennsylvania

B.S. summa cum laude

in Secondary Education

(Chemistry specialization)

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???Graduate???????????????????????????????????????????????? Ph.D., Iowa State University 1980

in analytical chemistry

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???Major Professors ??????????????????????????????????? V. A. Fassel and H. J. Svec

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???Dissertation Title ??????????????????????????????????? An Inductively Coupled Plasma

as an Ion Source for the

Determination of Trace Elements

in Solutions by Mass Spectrometry

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2. ?PROFESSIONAL EXPERIENCE

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Assistant Chemist II, Ames Laboratory-USDOE, Iowa State University

????February 1980-July 1981.

Assistant Professor of Chemistry and Associate Chemist,

????Ames Laboratory, Iowa State University, July 1, 1981 - June 30, 1987.

Associate Professor of Chemistry and Chemist, Ames Laboratory,

????July 1, 1987 - June 30, 1991.

Professor of Chemistry and Senior Chemist, Ames Laboratory,

????July 1, 1991 - present.

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3. HONORS, AWARDS AND PROFESSIONAL SOCIETIES?Selected

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ACS Award for Spectrochemical Analysis, Aug 2012

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Fellow, Society for Applied Spectroscopy (2007)

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Anachem Award, Association for Analytical Chemistry (affiliated with ACS Detroit Section), Detroit MI (2000). ?Previous winners include H. Diehl and V. A. Fassel.

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ACS Award for Chemical Instrumentation (1993)

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Maurice F. Hasler Award from Spectroscopy Society of Pittsburgh and Fisons (1993). ?This award recognizes "significant contributions to the field of spectroscopy that have resulted in applications of broad utility."

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Co-recipient, Lester W. Strock Award from Society for Applied Spectroscopy (1986)

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Original ICP-MS paper chosen to be reprinted as “one of the 60 most influential papers published in the journal Analytical Chemistry," 1994

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Associate Editor, Journal of the American Society for Mass Spectrometry (1989-1994)

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Guest Editor, V. A. Fassel Memorial Issue, Spectrochimica Acta, Part B (2000-01)

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Volume Editor, Inorganic Mass Spectrometry, Encyclopedia of Mass Spectrometry, 2002-2008

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Editorial Advisory Board, Spectrochimica Acta, Part B (1989-present)

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Editorial Advisory Board, Journal of Analytical Atomic Spectrometry (1995-2005)

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Editorial Advisory Board, Journal of the Iron & Steel Institute of Japan, (2000-2006)

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Chairman, Elemental Analysis Interest Group, American Society for Mass Spectrometry (1990-1994)

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4. ?RESEARCH INTERESTS

??????? Development and fundamental study of ionization techniques for analytical mass??

????????spectrometry, including inductively coupled plasmas, lasers, and electrospray ionization.

???????? Development of “soft” ionization techniques for identification of inorganic ions and

???????? complexes.

?????????Diagnostic studies of excitation, ionization, and energy transfer mechanisms in

???????? inductively coupled plasmas.

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???????? Novel techniques for observing optical radiation from inductively coupled plasmas.

???????? Advanced techniques for time-of-flight mass spectrometry, ion traps, high resolution

???????? mass spectrometry, and ion implantation.

??????????Chromatographic and spectroscopic techniques for measurement of elemental

????????? speciation.

??????????Ion mobility, ion-ion reactions, top-down “xxx-omics,” multiple stage tandem MS

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????????? MS of plant metabolites, atmospheric pressure MALDI

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5. ?CONTRIBUTED PAPERS

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1. "Evaluation of an Inductively Coupled Argon Plasma Operated at Atmospheric Pressure as an Ion Source for Analytical Mass Spectroscopy", 6th Annual Meeting of the Federation of Analytical Chemistry and Spectroscopy Societies, Philadelphia, PA, September 1979 (Paper No. 51).

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Too many contributed papers, quit counting in 1991.

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6. ?INVITED LECTURES

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1. "Analytical Capabilities of ICP-MS", EPA Review Symposium, Athens, GA, March 1979.

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More than 300 invited lectures have been given.

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7. LIST OF PUBLICATIONS

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?1. R. S. Houk, V. A. Fassel, G. D. Flesch, H. J. Svec, A. L. Gray and C. E. Taylor, "Inductively Coupled Argon Plasma as an Ion Source for Mass Spectrometric Determination of Trace Elements", Anal. Chem.?52, 2283-2289 (1980). ?This paper named winner of 1986 Lester W. Strock Award.

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?2. R. S. Houk, V. A. Fassel and H. J. Svec, "Inductively Coupled Plasma - Mass Spectrometry: ?Sample Introduction, Ionization, Ion Extraction, and Analytical Results" in Dynamic Mass Spectrometry; D. Price and J. F. J. Todd, Eds.; Heyden: London, 1981; Vol. 6, Chapter 19, pp. 234-251.

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?3. R. S. Houk, H. J. Svec and V. A. Fassel, "Mass Spectrometric Evidence for Suprathermal Ionization in an Inductively Coupled Argon Plasma", Appl. Spectrosc.?35, 380-384 (1981).

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?4. R. S. Houk, V. A. Fassel and H. J. Svec, "Mass Spectra of Polar Organic Compounds in Aqueous Solutions Introduced into an Inductively Coupled Plasma", Org. Mass. Spectrom.?17, 240-244 (1982).

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?5. R. S. Houk and J. J. Thompson, "Elemental and Isotopic Analysis of Solutions by Mass Spectrometry Using a Plasma Ion Source", American Mineralogist?67, 238-243 (1982).

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?6. R. S. Houk and J. J. Thompson, "Trace Metal Isotopic Analysis of Microliter Solution Volumes by Inductively Coupled Plasma Mass Spectrometry", Biomed. Mass Spectrom.?1983, 10, 107-112.

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69. H. Niu, K. Hu and R. S. Houk, "Langmuir Probe Measurements of Electron Temperature and Electron Density Behind the Skimmer of an ICP-MS," Spectrochim. Acta B?1991, 46B, 805-817.

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77. K. Hu, P. S. Clemons and R. S. Houk, "Analytical Characteristics of a New, Offset Ion Lens for ICP-MS. ?I. ?Ion Trajectories and Detector Performance," J. Amer. Soc. Mass Spectrom. 1993, 4, 16-27.

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78. K. Hu and R. S. Houk, "Analytical Characteristics of a New, Offset Ion Lens for ICP-MS. ?II. ?Reduction of Polyatomic Ion Interferences and Matrix Effects," J.?Amer. Soc. Mass Spectrom. 1993, 4, 28-37.

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80. K. Hu and R. S. Houk, "ICP-MS with an Electrically Floating Interface," J. Amer. Soc. Mass Spectrom., 1993, 4, 733-741.

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?????? 98. K. Hu and R. S. Houk, "Ion Deposition by ICP-MS," ?J. Vac. Sci. Technol. A.?1996,??

??????? 14, 370-373.

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???????? 173. A. Jesche, R. W. McCallum, S. Thimmaiah, J. L. Jacobs, V. Talfour, A. Kreyssig,

?R. S. Houk, S. L. Bud’ko, P. C. Canfield, Giant Magnetic Anisotropy and Tunneling?of the Magnetization in Li2(Li1-xFex)N, Nature Comms. 2014 doi 10.1038/ncomms4333.

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174. B. Hattendorf, B. Gusmini, L. Dorta, R. S. Houk, D. Guenther, Mass Spectrometric Observation of Doubly Charged Alkaline Earth – Argon Ions, ChemPhysChem 2016, 17, 2640-44.

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175. B. Hattendorf, B. Gusmini, L. Dorta, R. S. Houk, D. Guenther, Abundance and Impact of Doubly Charged Polyatomic Argon Interferences in ICP-MS S[ectra, Anal. Chem. 2016, 88, 7281-7288.

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8. ??RECENT RESEARCH

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Analytical Mass Spectrometry

Molecular Processes Program

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Laser Ablation ICP-MS for Profiling Solids as Evidence

improve analytical figures of merit of laser ablation ICP-MS for direct analysis of solids. ?

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The Origins of Polyatomic Ions in ICP-MS

NSF, Analytical and Surface Chemistry Program

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Elemental Analysis of Automobile Putty for Forensic Purposes

Midwest Forensic Research Center

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Mass Spectrometric Imaging of Plant Metabolites

investigate imaging possibilities with high-pressure MALDI

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High Resolution MS with a Multiple Pass Quadrupole MS for Nuclear Applications

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Trace Element Contents of Garnet and Gahnite as Guides in the Exploration for

Metamorphosed Copper-Lead-Zinc-Silver-Gold Deposits

by Laser-Ablation ICP-MS

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Phosphorylation in Proteins

Plant Sciences Institute, ISU

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High Spectral Resolution with a Multiple Pass Quadrupole Mass Analyzer

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ICP-MS for Analysis of Microliter Samples and Solids

Office of Technology Development

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Measurement of Radionuclides and Trace Element Speciation by Electrospray ?Mass?

Spectrometry

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