Ambient AFM/MFM 原子力顯微鏡
上海伯東代理英國 NanoMagnetics AFM - 原子力顯微鏡, 高精度和高分辨率使其可以分析許多不同樣品, AFM - 原子力顯微鏡可以在液體或空氣中測量. 手動校準(zhǔn), 采用白光 LED, 亮度可調(diào), 視野更佳. Z 噪音降至25 fm/ Hz.
Ambient AFM/MFM 原子力顯微鏡系統(tǒng)參數(shù)
標(biāo)準(zhǔn)掃描模式
Intermittent Contact / Phase Contrast
Contact
Non-contact
Lateral Force
MFM
EFM
(Any single mode standard, additional modes may be
added as options.)
可選掃描模式
Scanning Tunneling Microscope (STM)
Piezo Response Force Microscope (PrFM)
Kelvin Probe Force Microscope (KPFM)
Scanning Spreading Resistance Microscope (SSRM)
Conductive AFM
Capacitance Force Microscopy (CFM)
Force Modulation Microscopy (FMM)
AFM Spectroscopies
Nanoindentation
Nanolitography
Maximum Z Resolution
0.03nm with 100 mx100 m scanner
0.01nm with 40 mx40 m scanner
0.005nm with 4 mx4 m scanner
Static/Dynamic RMS Cantilever Z Noise
25fm Hz noise floor with laser RF modulation
Scan Range
4x4x2 m or 40x40x4 m or 100x100x8 m
STM Current Range
1pA-10nA, 10fA / Hz noise floor
Maximum Sample Size/Height
30x30x10 mm
Approach
Software controlled
Motorized
50 mm range with 250 nm sensivity
Camera
CCD analog colour camera
Camera Resolution
2 m
Light Source for Optical Microscope
White LED, adjustable from software
Signal Processing
16 bit ADCs / 24 bit DACs
Digital feedback with FPGA / DSP
Simultaneous scan of 16 channels
up to 4096x4096 pixels
Cantilevers
All of the commercial cantilevers can be used
Acoustic and Vibration Isolation
Multilayer acoustic enclosure 180 access
0.3Hz passive vibration isolation table

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